产品介绍 价格电议!!!AFM - 原子力显微镜 上海伯东代理英国 NanoMagnetics AFM - 原子力显微镜, 高精度和高分辨率使其可以分析许多不同样品, AFM - 原子力显微镜可以在液体或空气中测量. 手动校准, 采用白光 LED, 亮度可调, 视野更佳. Z 噪音降至25 fm/√Hz. AFM - 原子力显微镜系统参数 标准扫描模式 * Intermittent Contact / Phase Contrast * Contact * Non-contact * Lateral Force * MFM * EFM (Any single mode standard, additional modes may be added as options.) 可选扫描模式 * Scanning Tunneling Microscope (STM) * Piezo Response Force Microscope (PrFM) * Kelvin Probe Force Microscope (KPFM) * Scanning Spreading Resistance Microscope (SSRM) * Conductive AFM * Capacitance Force Microscopy (CFM) * Force Modulation Microscopy (FMM) * AFM Spectroscopies * Nanoindentation * Nanolitography Maximum Z Resolution * <0.03nm with 100μmx100μm scanner * <0.01nm with 40μmx40μm scanner * <0.005nm with 4μmx4μm scanner Static/Dynamic RMS Cantilever Z Noise * <25fm √hz noise floor with laser rf modulation Scan Range * 4x4x2 μm or 40x40x4 μm or 100x100x8 μm STM Current Range * 1pA-10nA, < 10fA / √Hz noise floor Maximum Sample Size/Height * 30x30x10 mm Approach * Software controlled * Motorized * <50 mm range with <250 nm sensivity Camera * CCD analog colour camera Camera Resolution * < 2 μm Light Source for Optical Microscope * White LED, adjustable from software Signal Processing * 16 bit ADCs / 24 bit DACs * Digital feedback with FPGA / DSP * Simultaneous scan of 16 channels up to 4096x4096 pixels Cantilevers * All of the commercial cantilevers can be used Acoustic and Vibration Isolation * Multilayer acoustic enclosure 180°access 0.3Hz passive vibration isolation table Polyethyleneimine Phosphorylcolamine Topography Phosphorylcolamine Phase Contrast Polyvinyl Acetate 英国 NanoMagnetics 仪器 1998年在牛津成立, 作为原子力显微镜 AFM 制造商, 主营环境扫描探针显微镜 SPM, 低温扫描探针显微镜 LT-SPM 等, 适用于产品表面特征分析, 生命科学, 原位成像, 材料科学, 薄膜等领域. 原子力显微镜 AFM 广泛应用于牛津大学, 斯坦福, 京都大学, NASA 等学府和科研院所. |
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